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Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time
In Su Park , Young Sul Shin , Sung Ho Ahn , Jin Sam Kim , Jae Young Kim , Woo Jin Lee The KIPS Transactions:PartD,
Vol. 17, No. 2, pp. 147-156,
Apr.
2010
10.3745/KIPSTD.2010.17.2.147
10.3745/KIPSTD.2010.17.2.147
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